This position is part of the National Institute of Standards (NIST) Professional Research Experience (PREP) program. NIST recognizes that its research staff may wish to collaborate with researchers at academic institutions on specific projects of mutual interest, thus requires that such institutions must be the recipient of a PREP award. The PREP program requires staff from a wide range of backgrounds to work on scientific research in many areas. Employees in this position will perform technical work that underpins the scientific research of the collaboration.
The position is focused on research and development of scanning transmission electron microscopy (STEM) and scanning electron microscopy based (SEM) focused ion beam – secondary ion mass spectrometry (FIB-SIMS) techniques for metrology of a variety of materials.  The effect of FIB instrument settings on FIB-SIMS data quality and reproducibility will be examined and optimized for at least two materials. The influence of FIB parameters on AlGaN TEM lamella during preparation will be established and optimized for minimum sample damage. STEM measurements of AlGaN material and device morphology, polarity and composition will be performed and correlated with growth conditions. Results will be communicated to collaborators and presented and/or published as appropriate.
Key responsibilities will include but are not limited to:
- Research and develop scanning transmission electron microscopy (STEM) and related spectroscopies for metrology of wide and ultra-wide bandgap semiconductor devices and epilayers.
- Research and develop focused ion beam (FIB) preparation of AlGaN lamella for transmission electron microscopy (TEM); comparison of damage caused by various preparation parameters.
- Research and develop focused ion beam – secondary ion mass spectrometry (FIB-SIMS) to establish the technique reproducibility, best practices and potential for quantitative analysis.
- Research and develop correlative microscopy methods for industry-relevant materials.
- Communicate and collaborate with team members. Present and publish results as appropriate.
Qualifications
- A PhD in Materials Science and Engineering, or a related field.
- Four or more years of experience with advanced scanning transmission electron microscopy (STEM) techniques.
- Experience with STEM based spectroscopies (EDS and EELS).
- Experience operating a focused ion beam (FIB) and scanning electron microscope (SEM).
- Development and application of FIB-SIMS.
- Familiarity with materials electron diffraction and RHEED.
- Strong oral and written communication skills.
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Authority: 15 U.S.C. § 278g-1(e)(1) and (e)(3) and 15 U.S.C. § 272(b) and (c)
Purpose: The National Institute for Standards and Technology (NIST) hosts the  Professional Research Experience Program (PREP) which is designed to provide valuable laboratory experience and financial assistance to undergraduates, post-bachelor’s degree holders, graduate students, master’s degree holders, postdocs, and faculty.
PREPÂ is a 5-year cooperative agreement between NIST laboratories and participating PREP Universities to establish a collaborative research relationship between NIST and U.S. institutions of higher education in the following disciplines including (but may not be limited to) biochemistry, biological sciences, chemistry, computer science, engineering, electronics, materials science, mathematics, nanoscale science, neutron science, physical science, physics, and statistics. This collection of information is needed to facilitate administrative functions of the PREP Program.
Routine Uses:Â NIST will use the information collected to perform the requisite reviews of the applications to determine eligibility, and to meet programmatic requirements. Disclosure of this information is also subject to all the published routine uses as identified in the Privacy Act System of Records Notices:Â NIST-1: NIST Associates.
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